QUANTITATIVE ELECTRON-DIFFRACTION FROM THIN-FILMS

被引：21
作者：
LAGALLY, MG
SAVAGE, DE
机构：
[1] UNIV WISCONSIN,DEPT PHYS,MADISON,WI 53706
[2] UNIV WISCONSIN,MAT SCI PROGRAM,MADISON,WI 53706
来源：
MRS BULLETIN | 1993年 / 18卷 / 01期
关键词：
D O I：
10.1557/S0883769400043414
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：24 / 31
页数：8
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