DIELECTRIC-BREAKDOWN IN ELECTRICALLY STRESSED THIN-FILMS OF THERMAL SIO2

[1] ION-IMPLANTATION EFFECTS IN NONCRYSTALLINE SIO2 [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1973, NS20 (06) : 220 - 223

[2] BARRETT CR, 1976, TECH DIG 1976 IEEE I, P319

[3] EFFECTS OF MATERIAL AND PROCESSING PARAMETERS ON DIELECTRIC STRENGTH OF THERMALLY GROWN SIO2 FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1970, 117 (10) : 1287 - +

[4] IMPACT IONIZATION MODEL FOR DIELECTRIC INSTABILITY AND BREAKDOWN [J]. APPLIED PHYSICS LETTERS, 1974, 25 (12) : 685 - 687

[5] IMPACT IONIZATION IN SILICON DIOXIDE [J]. SOLID STATE COMMUNICATIONS, 1976, 18 (08) : 1051 - 1053

[6] LOW-TEMPERATURE IRRADIATION EFFECTS IN SIO2-INSULATED MIS DEVICES [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (03) : 1310 - 1317

[7] CONDUCTION AND TRAPPING OF ELECTRONS IN HIGHLY STRESSED ULTRATHIN FILMS OF THERMAL SIO2 [J]. APPLIED PHYSICS LETTERS, 1977, 30 (11) : 601 - 603

[8] HOLE TRANSPORT IN MOS OXIDES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, 22 (06) : 2227 - 2233

[9] JENQ CS, COMMUNICATION

[10] JOHNSON WC, 1976, RADCTR76158 PRINC U, P17

[1] ION-IMPLANTATION EFFECTS IN NONCRYSTALLINE SIO2 [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1973, NS20 (06) : 220 - 223

[2] BARRETT CR, 1976, TECH DIG 1976 IEEE I, P319

[3] EFFECTS OF MATERIAL AND PROCESSING PARAMETERS ON DIELECTRIC STRENGTH OF THERMALLY GROWN SIO2 FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1970, 117 (10) : 1287 - +

[4] IMPACT IONIZATION MODEL FOR DIELECTRIC INSTABILITY AND BREAKDOWN [J]. APPLIED PHYSICS LETTERS, 1974, 25 (12) : 685 - 687

[5] IMPACT IONIZATION IN SILICON DIOXIDE [J]. SOLID STATE COMMUNICATIONS, 1976, 18 (08) : 1051 - 1053

[6] LOW-TEMPERATURE IRRADIATION EFFECTS IN SIO2-INSULATED MIS DEVICES [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (03) : 1310 - 1317

[7] CONDUCTION AND TRAPPING OF ELECTRONS IN HIGHLY STRESSED ULTRATHIN FILMS OF THERMAL SIO2 [J]. APPLIED PHYSICS LETTERS, 1977, 30 (11) : 601 - 603

[8] HOLE TRANSPORT IN MOS OXIDES [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, 22 (06) : 2227 - 2233

[9] JENQ CS, COMMUNICATION

[10] JOHNSON WC, 1976, RADCTR76158 PRINC U, P17