ANALYTICAL ELECTRON-MICROSCOPY OF MULTILAYERED THIN-FILMS USING MICROCLEAVAGE

被引：11

作者：

LEPETRE, Y

SCHULLER, IK

RASIGNI, G

RIVOIRA, R

PHILIP, R

DHEZ, P

机构：

[1] UNIV PARIS SUD, LURE, F-91408 ORSAY, FRANCE

[2] UNIV AIX MARSEILLE 3, DEPT PHYS INTERACT PHOTONS MAT, F-13397 MARSEILLE 13, FRANCE

来源：

OPTICAL ENGINEERING | 1986年 / 25卷 / 08期

关键词：

D O I：

10.1117/12.7973934

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：948 / 953

页数：6

共 50 条

[1] THIN-FILMS OBSERVED BY MICROCLEAVAGE TRANSMISSION ELECTRON-MICROSCOPY
LEPETRE, Y
SCHULLER, IK
JOURNAL OF METALS, 1986, 38 (10): : 26 - 27
[2] CHARACTERIZATION OF THIN-FILMS BY ANALYTICAL ELECTRON-MICROSCOPY
HEADLEY, TJ
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06): : 2902 - 2904
[3] ANALYTICAL ELECTRON-MICROSCOPY OF THIN-FILMS AND INTERFACES
GEISS, RH
THIN SOLID FILMS, 1992, 220 (1-2) : 154 - 159
[4] ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY OF THIN-FILMS
GEISS, RH
HUANG, TC
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 140 - 143
[5] THIN-FILMS IN ELECTRON-MICROSCOPY
MULLER, T
PULKER, HK
POLYMER-PLASTICS TECHNOLOGY AND ENGINEERING, 1995, 34 (06) : 961 - 988
[6] CHARACTERIZATION OF THIN-FILMS AND INTERFACES BY MEANS OF ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY
VIEGERS, MPA
SURFACE AND INTERFACE ANALYSIS, 1986, 9 (1-6) : 72 - 72
[7] TRANSMISSION ELECTRON-MICROSCOPY OF MOLECULAR THIN-FILMS
WRIGHT, AC
LUK, S
WILLIAMS, JO
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 301 - 302
[8] ELECTRON-MICROSCOPY OF MAGNETIC STRUCTURE OF THIN-FILMS
PETROV, VI
PAVLYUCH.OP
SPIVAK, GV
USPEKHI FIZICHESKIKH NAUK, 1972, 106 (02): : 229 - +
[9] TRANSMISSION ELECTRON-MICROSCOPY OF MOLECULAR THIN-FILMS
WRIGHT, AC
LUK, S
WILLIAMS, JO
EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 301 - 302
[10] ANALYTICAL ELECTRON-MICROSCOPY AND RAMAN-SPECTROSCOPY STUDIES OF CARBON NITRIDE THIN-FILMS
CHEN, MY
LI, D
LIN, X
DRAVID, VP
CHUNG, YW
WONG, MS
SPROUL, WD
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1993, 11 (03): : 521 - 524

← 1 2 3 4 5 →