MODELING HIGH-CONCENTRATION BORON-DIFFUSION WITH DYNAMIC CLUSTERING - INFLUENCE OF THE INITIAL CONDITIONS

被引:2
|
作者
BACCUS, B
VANDENBOSSCHE, E
机构
[1] IEMN-ISEN, 59046 Lille cedex
关键词
D O I
10.1016/0026-2692(95)98924-G
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Boron diffusion and activation at high concentrations are key problems in the formation of shallow P+ junctions. Therefore, it is necessary to understand and to predict accurately the dopant behaviour under these conditions. In this paper, the modelling of boron is discussed, by the use of a non-equilibrium point-defect model, including amorphization and a dynamic clustering component. The initial conditions are of major importance, not only for the transient enhanced diffusion, but also for the amount of active dopants. As a result, it is possible to obtain activation levels greater than the solid solubility, as observed experimentally.
引用
收藏
页码:235 / 242
页数:8
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