AUTOMATIC S-PARAMETER CHARACTERIZATION OF MICROWAVE DEVICES AND CIRCUITS USING A PHASE LOCKED AUTOMATIC NETWORK ANALYZER (PLANA)

被引：0
|
作者：
PERLMAN, BS
机构：
来源：
RCA REVIEW | 1981年 / 42卷 / 04期
关键词：
Compendex;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
MICROWAVE DEVICES
引用
收藏
页码：770 / 784
页数：15
相关论文
共 12 条
  • [1] CALIBRATION OF AUTOMATIC SYSTEM FOR S-PARAMETER MEASUREMENT OF MICROWAVE INTEGRATED CIRCUITS.
    Barta, Jan
    Tesla electronics, 1983, 16 (02): : 52 - 56
  • [2] A homodyne multiport network analyzer for S-parameter measurements of microwave N-port circuits/systems
    Boulejfen, N
    Kouki, AB
    Ghannouchi, FM
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2000, 24 (01) : 63 - 67
  • [3] CALIBRATION OF MICROWAVE NETWORK ANALYZER FOR COMPUTER CORRECTED S-PARAMETER MEASUREMENTS
    DASILVA, EF
    MCPHUN, MK
    ELECTRONICS LETTERS, 1973, 9 (06) : 126 - 128
  • [4] MATCHING NETWORK CHARACTERIZATION BY S-PARAMETER MEASUREMENTS OF 2-PORT ACTIVE DEVICES
    SOARES, R
    GOUZIEN, P
    LEGAUD, P
    IEE PROCEEDINGS-H MICROWAVES ANTENNAS AND PROPAGATION, 1988, 135 (06) : 426 - 430
  • [5] A method for on-wafer S-parameter measurement of a differential amplifier by using two-port network analyzer
    Sun, Ling
    Wang, Zhigong
    Gao, Jianjun
    2005 ASIA-PACIFIC MICROWAVE CONFERENCE PROCEEDINGS, VOLS 1-5, 2005, : 3088 - 3091
  • [6] A homodyne multi-port network analyzer for S parameter measurements of microwave N-port circuits/systems
    Boulejfen, N
    Kouki, AB
    Khouaja, AB
    Ghannouchi, FM
    APCCAS '98 - IEEE ASIA-PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS: MICROELECTRONICS AND INTEGRATING SYSTEMS, 1998, : 687 - 689
  • [7] A fully-scalable de-embedding method for on-wafer S-parameter characterization of CMOS RF/microwave devices
    Cho, MH
    Chiu, CS
    Huang, GW
    Teng, YM
    Chang, LH
    Chen, KM
    Chen, WL
    2005 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS, 2005, : 303 - 306
  • [8] Uncertainties associated with many-port (>4) S-parameter measurements using a four-port vector network analyzer
    Martens, J
    Judge, DV
    Bigelow, JA
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2004, 52 (05) : 1361 - 1368
  • [9] 80 Gbit/s optical clock recovery with automatic lock acquisition using electrical phase-locked loop
    Vehovc, S
    Vidmar, M
    Paoletti, A
    ELECTRONICS LETTERS, 2003, 39 (08) : 673 - 674
  • [10] De-embedding technique relying on a new formalism for two-port network characterization using raw S-parameter measurements
    Hasar, Ugur Cem
    Ozturk, Hamdullah
    MEASUREMENT, 2024, 225
12