COMPUTER-SIMULATION OF HIGH-RESOLUTION ELECTRON-MICROGRAPHS USING DYNAMICAL ELECTRON-SCATTERING

被引：12
作者：
KRAKOW, W
机构：
来源：
IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1981年 / 25卷 / 01期
关键词：
D O I：
10.1147/rd.251.0058
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
30
引用
收藏
页码：58 / 70
页数：13
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