DIAGNOSING MULTIPLE FAULTS

被引：850
作者：
DEKLEER, J [1 ]
WILLIAMS, BC [1 ]
机构：
[1] MIT, ARTIFICIAL INTELLIGENCE LAB, CAMBRIDGE, MA 02139 USA
来源：
ARTIFICIAL INTELLIGENCE | 1987年 / 32卷 / 01期
关键词：
D O I：
10.1016/0004-3702(87)90063-4
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
ELECTRONIC CIRCUITS
引用
收藏
页码：97 / 130
页数：34
相关论文
共 36 条
[1]   PATTERN-BASED INTERACTIVE DIAGNOSIS OF MULTIPLE DISORDERS - MEDAS SYSTEM [J].
BENBASSAT, M ;
CARLSON, RW ;
PURI, VK ;
DAVENPORT, MD ;
SCHRIVER, JA ;
LATIF, M ;
SMITH, R ;
PORTIGAL, LD ;
LIPNICK, EH ;
WEIL, MH .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1980, 2 (02) :148-160
[2]  
BENBASSAT M, 1978, IEEE T COMPUT, V27, P170, DOI 10.1109/TC.1978.1675054
[3]  
BENBASSAT M, 1980, IEEE T SYST MAN CYB, V10, P331
[4]  
Brown J.S., 1982, INTELLIGENT TUTORING, P227
[5]  
CAMPBELL SS, 1986, SNERG15 SUNY BUFF DE
[6]  
CANTONE RR, 1986, COMPUTER EXPERT SYST
[7]   DIAGNOSTIC REASONING BASED ON STRUCTURE AND BEHAVIOR [J].
DAVIS, R .
ARTIFICIAL INTELLIGENCE, 1984, 24 (1-3) :347-410
[8]   AN ASSUMPTION-BASED TMS [J].
DEKLEER, J .
ARTIFICIAL INTELLIGENCE, 1986, 28 (02) :127-162
[9]   PROBLEM-SOLVING WITH THE ATMS [J].
DEKLEER, J .
ARTIFICIAL INTELLIGENCE, 1986, 28 (02) :197-224
[10]  
DEKLEER J, 1976, AI394 MIT ART INT LA
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