DIAGNOSING MULTIPLE FAULTS

被引：837
作者：
DEKLEER, J [1 ]
WILLIAMS, BC [1 ]
机构：
[1] MIT, ARTIFICIAL INTELLIGENCE LAB, CAMBRIDGE, MA 02139 USA
来源：
ARTIFICIAL INTELLIGENCE | 1987年 / 32卷 / 01期
关键词：
D O I：
10.1016/0004-3702(87)90063-4
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
ELECTRONIC CIRCUITS
引用
收藏
页码：97 / 130
页数：34
相关论文
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