RELIABILITY EVALUATION OF A 2-UNIT UNREPAIRABLE SYSTEM

被引：7
作者：
YAMADA, S
OSAKI, S
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1980年 / 20卷 / 05期
关键词：
D O I：
10.1016/0026-2714(80)90388-1
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：589 / 597
页数：9
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