XRF WITH A PRIMARY X-RAYS FROM THE TARGET WITH MONOISOTOPICAL SURFACE LAYER

被引:0
|
作者
Levenets, V. [1 ]
Omelnik, O. [1 ]
Shchur, A. [1 ]
机构
[1] Kharkov Inst Phys & Technol, Natl Sci Ctr, Kharkov, Ukraine
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中图分类号
O57 [原子核物理学、高能物理学];
学科分类号
070202 ;
摘要
The development is presented of X-Rays fluorescence analysis using as primary source proton induced X-Rays emission. It is offered to make primary target as double-layer using as the backing natural intermixture of isotopes, and as the upper layer. an isotope with the highest threshold of (p, n)-reaction for given element. Such target allows to reach lower detection limits by decreasing of background gamma-emission from (p,n)-reactions. The making of target from copper, nickel, zirconium, and molybdenum are discussed. The presented approach has been used for elemental analysis of the samples of zirconium compounds and alloys, soils, plants and sediments.
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页码:99 / 101
页数:3
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