TESTING MEMORIES FOR SINGLE-CELL PATTERN-SENSITIVE FAULTS

被引：0

作者：

HAYES, JP ^{[1
]}

机构：

[1] UNIV SO CALIF,DEPT COMP SCI,LOS ANGELES,CA 90007

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1980年 / 29卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：249 / 254

页数：6

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