EPICON ARRAY - A NEW SEMICONDUCTOR ARRAY-TYPE CAMERA TUBE STRUCTURE

被引:15
作者
ENGELER, WE
BLUMENFELD, M
TAFT, EA
机构
关键词
D O I
10.1063/1.1653162
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:202 / +
页数:1
相关论文
共 17 条
[1]  
BENNETT CJ, 1969, JUN INT C MICR EASTB
[2]  
BOOKER GR, 1967, PHILOS MAG, P301
[3]   A NEW MASKING TECHNIQUE FOR SEMICONDUCTOR PROCESSING [J].
BROWN, DM ;
ENGELER, WE ;
GARFINKE.M ;
HEUMANN, FK .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (07) :730-&
[4]   INFLUENCE OF BULK AND SURFACE PROPERTIES ON IMAGE SENSING SILICON DIODE ARRAYS [J].
BUCK, TM ;
CASEY, HC ;
DALTON, JV ;
YAMIN, M .
BELL SYSTEM TECHNICAL JOURNAL, 1968, 47 (09) :1827-+
[5]   DIODE ARRAY CAMERA TUBES AND X-RAY IMAGING [J].
CHESTER, AN ;
LOOMIS, TC ;
WEISS, MM .
BELL SYSTEM TECHNICAL JOURNAL, 1969, 48 (02) :345-+
[6]   SILICON DIODE ARRAY CAMERA TUBE [J].
CROWELL, MH ;
LABUDA, EF .
BELL SYSTEM TECHNICAL JOURNAL, 1969, 48 (05) :1481-+
[7]   A CAMERA TUBE WITH SILICON DIODE ARRAY TARGET [J].
CROWELL, MH ;
BUCK, TM ;
LABUDA, EF ;
DALTON, JV ;
WALSH, EJ .
BELL SYSTEM TECHNICAL JOURNAL, 1967, 46 (02) :491-+
[8]  
CROWELL MH, 1967, ISSCC DIGEST TECHNIC, P128
[9]  
ENGELER WE, 1969, OCT INT EL DEV M IEE
[10]   A CHARGE STORAGE TARGET FOR ELECTRON IMAGE SENSING [J].
GORDON, EI ;
CROWELL, MH .
BELL SYSTEM TECHNICAL JOURNAL, 1968, 47 (09) :1855-+