OBSERVATION OF THE SWITCHING FIELDS OF INDIVIDUAL PERMALLOY PARTICLES IN NANOLITHOGRAPHIC ARRAYS VIA MAGNETIC FORCE MICROSCOPY

被引：49

作者：

GIBSON, GA

SMYTH, JF

SCHULTZ, S

KERN, DP

机构：

[1] UNIV CALIF SAN DIEGO,CTR MAGNET RECORDING RES,LA JOLLA,CA 92093

[2] IBM CORP,YORKTOWN HTS,NY 10598

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1991年 / 27卷 / 06期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/20.278782

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A technique has been developed for measuring the switching fields of individual sub-micron magnetic particles using a magnetic force microscope (MFM) in which an in situ magnetic field can be applied. This allows the study of the evolution of the particles' magnetic states as a function of applied field and the direct observation of cooperative switching. Observations of the switching fields for individual nanolithographic permalloy particles are compared with remanent magnetization data, taken with an alternating gradient magnetometer (AGM), on both isolated and interactive arrays of these particles. Comparison of MFM images of the particles with numerical simulations has provided insight into the magnetic behavior of the sensing tips.

引用

页码：5187 / 5189

页数：3

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