TEMPERATURE-DEPENDENCE OF LOW-FREQUENCY CHARACTERISTICS OF JUNCTION FIELD-EFFECT TRANSISTORS

被引:1
作者
GRIMBLEBY, JB [1 ]
SANGHERA, GS [1 ]
机构
[1] UNIV READING, JJ THOMSON PHYS LAB, READING RG6 2AF, BERKSHIRE, ENGLAND
来源
RADIO AND ELECTRONIC ENGINEER | 1977年 / 47卷 / 06期
关键词
D O I
10.1049/ree.1977.0041
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:277 / 282
页数:6
相关论文
共 10 条
[1]  
[Anonymous], FIELD EFFECT TRANSIS
[2]   TEMPERATURE COEFFICIENT OF RESISTIVITY OF SILICON AND GERMANIUM NEAR ROOM TEMPERATURE [J].
BULLIS, WM ;
BREWER, FH ;
KOLSTAD, CD ;
SWARTZEN.LJ .
SOLID-STATE ELECTRONICS, 1968, 11 (07) :639-&
[3]  
COBBOLD RSC, 1964, P I ELECTR ENG, V111, P1981
[4]  
EVANS LL, 1964, ELECTROTECHNOLOGY, V7, P93
[5]  
GOSLING W, 1971, FIELD EFFECT ELECTRO
[6]   CONDITIONS FOR A TEMPERATURE COMPENSATED SILICON FIELD EFFECT TRANSISTOR [J].
HOERNI, JA ;
WEIR, B .
PROCEEDINGS OF THE IEEE, 1963, 51 (07) :1058-&
[7]   THE COMBINATION OF RESISTIVITIES IN SEMICONDUCTORS [J].
JOHNSON, VA ;
LARKHOROVITZ, K .
PHYSICAL REVIEW, 1951, 82 (06) :977-978
[8]  
STEVENS M, B51 TEX INSTR APPL R
[9]  
TODD CD, 1966, ELECTRONIC COMPONENT, V7, P571
[10]  
1969, TP1112 MULL APPL NOT