QUANTITATIVE SURFACE-TOPOGRAPHY DETERMINATION BY NOMARSKI REFLECTION MICROSCOPY .2. MICROSCOPE MODIFICATION, CALIBRATION, AND PLANAR SAMPLE EXPERIMENTS

被引：29

作者：

HARTMAN, JS

GORDON, RL

LESSOR, DL

机构：

来源：

APPLIED OPTICS | 1980年 / 19卷 / 17期

关键词：

D O I：

10.1364/AO.19.002998

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：2998 / 3009

页数：12

相关论文

共 5 条

[1] INTERFERENCE CONTRAST EMPLOYED TO MEASURE SLOPES ON METALLOGRAPHIC SPECIMENS
BERTOCCI, U
NOGGLE, TS
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (12) : 1750 - &
[2] INSTRUMENT FOR MEASURING ROUGHNESS OF SUPERSMOOTH SURFACES
HILDEBRAND, BP
GORDON, RL
ALLEN, EV
[J]. APPLIED OPTICS, 1974, 13 (01) : 177 - 180
[3] LANG W, 1971, ZEISS INFORMATION, V77, P22
[4] QUANTITATIVE SURFACE-TOPOGRAPHY DETERMINATION BY NOMARSKI REFLECTION MICROSCOPY .1. THEORY
LESSOR, DL
HARTMAN, JS
GORDON, RL
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (02) : 357 - 366
[5] AN ALGORITHM FOR LEAST-SQUARES ESTIMATION OF NONLINEAR PARAMETERS
MARQUARDT, DW
[J]. JOURNAL OF THE SOCIETY FOR INDUSTRIAL AND APPLIED MATHEMATICS, 1963, 11 (02): : 431 - 441