ELLIPSOMETRIC STUDY OF THE AG (SINGLE-CRYSTAL) NAF INTERFACE WITH A VIEW TO OBTAINING THE ELECTRON-DISTRIBUTION PROFILE

被引:11
作者
CHAO, F
COSTA, M
CHERRAK, R
LECOEUR, J
BELLIER, JP
机构
关键词
D O I
10.1016/0022-0728(87)85128-8
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
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页码:19 / 37
页数:19
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共 33 条
[1]   OPTICAL-PROPERTIES OF VERY THIN-FILMS [J].
ABELES, F .
THIN SOLID FILMS, 1976, 34 (02) :291-302
[2]   A MICROSCOPIC MODEL FOR THE LIQUID-METAL IONIC SOLUTION INTERFACE [J].
BADIALI, JP ;
ROSINBERG, ML ;
VERICAT, F ;
BLUM, L .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1983, 158 (02) :253-267
[3]   POST ELECTROCHEMICAL STUDIES BY LEED AND AES OF THE SUPERFICIAL ATOMIC-STRUCTURE OF A AU(110) ELECTRODE [J].
BELLIER, JP ;
LECOEUR, J ;
ROUSSEAU, A .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1986, 200 (1-2) :55-67
[4]   STATIC ELECTRONIC PERTURBATIONS OF METALLIC SURFACES [J].
BUDD, HF ;
VANNIMENUS, J .
PHYSICAL REVIEW B, 1975, 12 (02) :509-513
[5]  
CATALAN LA, 1971, THESIS PARIS
[6]   CALCULATION OF THE LUMINOUS FLUX OUT OF A PHOTOMETRIC ELLIPSOMETER WITH PHASE AND AZIMUTH MODULATION [J].
CHAO, F ;
COSTA, M .
JOURNAL DE CHIMIE PHYSIQUE ET DE PHYSICO-CHIMIE BIOLOGIQUE, 1981, 78 (05) :411-419
[7]   THE ELECTROCHEMICAL INTERFACE, A STRATIFIED MEDIUM STUDIED BY ELLIPSOMETRY [J].
CHAO, F ;
COSTA, M .
SURFACE SCIENCE, 1983, 135 (1-3) :497-520
[8]  
CHAO F, 1985, SURF SCI, V157, pL328, DOI 10.1016/0039-6028(85)90625-9
[9]   ABSENCE OF SIDE-EFFECTS IN ELECTROCHEMICAL MEASUREMENTS OF SINGLE-CRYSTALS - TEST OF AG/PB2+ AND AU/CU2+ ADSORPTION SYSTEMS [J].
DICKERTMANN, D ;
KOPPITZ, FD ;
SCHULTZE, JW .
ELECTROCHIMICA ACTA, 1976, 21 (11) :967-971
[10]   INVESTIGATION OF OPTICAL PROPERTIES OF AG BY MEANS OF THIN SEMI-TRANSPARENT FILMS [J].
DUJARDIN, MM ;
THEYE, ML .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1971, 32 (09) :2033-&