HALL-MOBILITY AND DEFECT STRUCTURE IN UNDOPED AND CR OR TI-DOPED COO AT HIGH-TEMPERATURE

被引:59
作者
GVISHI, M
TANNHAUSER, DS
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D O I
10.1016/S0022-3697(72)80105-7
中图分类号
O6 [化学];
学科分类号
0703 ;
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页码:893 / +
页数:1
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