MOLECULAR-BEAM AND SOLID-PHASE EPITAXIES OF SILICON UNDER ULTRAHIGH-VACUUM

被引:35
作者
SHIRAKI, Y
KATAYAMA, Y
KOBAYASHI, KLI
KOMATSUBARA, KF
机构
关键词
D O I
10.1016/0022-0248(78)90451-7
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:287 / 291
页数:5
相关论文
共 8 条
[1]   SOLID-PHASE TRANSPORT AND EPITAXIAL-GROWTH OF GE AND SI [J].
CANALI, C ;
MAYER, JW ;
OTTAVIANI, G ;
SIGURD, D ;
VANDERWE.W .
APPLIED PHYSICS LETTERS, 1974, 25 (01) :3-5
[2]   CHANNELING EFFECT MEASUREMENTS OF RECRYSTALLIZATION OF AMORPHOUS SI LAYERS ON CRYSTAL SI [J].
CSEPREGI, L ;
MAYER, JW ;
SIGMON, TW .
PHYSICS LETTERS A, 1975, 54 (02) :157-158
[4]  
JONA F, 1967, SURFACES INTERFACES
[5]  
OTA Y, 1977, J ELECTROCHEM SOC, V124, P1745
[6]   SILICON EPITAXY BY SOLID-PHASE CRYSTALLIZATION OF DEPOSITED AMORPHOUS FILMS [J].
ROTH, JA ;
ANDERSON, CL .
APPLIED PHYSICS LETTERS, 1977, 31 (10) :689-691
[7]   LOW-TEMPERATURE EPITAXIAL GROWTH OF DOPED SILICON FILMS AND JUNCTIONS [J].
THOMAS, RN ;
FRANCOMBE, MH .
SOLID-STATE ELECTRONICS, 1969, 12 (10) :799-+