ANALYSIS OF RELIABILITY BOUNDS FOR 2-UNIT PARALLEL AND STANDBY REPAIRABLE SYSTEMS

被引：0

作者：

GUPTA, R

CHAUDHARY, A

机构：

[1] Department of Statistics, Institute of Advanced Studies, Meerut University, Meerut

来源：

MICROELECTRONICS AND RELIABILITY | 1995年 / 35卷 / 01期

关键词：

D O I：

10.1016/0026-2714(93)E0001-P

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper investigates the least upper bounds (LUB) and greatest lower bounds (GLB) for the reliability of two-unit parallel and standby reparable systems. The bounds are in terms of the failure and repair rates of a unit, when the distributions of failure and repair times are assumed to be negative exponential.

引用

页码：113 / 115

页数：3

共 6 条

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SHARMA, KK
[J]. MICROELECTRONICS AND RELIABILITY, 1991, 31 (06): : 1069 - 1071

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