CALCULATION OF CONCENTRATION PROFILES AND SURFACE CONCENTRATION FROM SHEET-CONDUCTANCE MEASUREMENTS OF DIFFUSED LAYERS

被引：14
作者：
LAMORTE, MF
机构：
来源：
SOLID-STATE ELECTRONICS | 1960年 / 1卷 / 03期
关键词：
D O I：
10.1016/0038-1101(60)90002-2
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：164 / 171
页数：8
相关论文
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