SOFT ERRORS INDUCED BY ENERGETIC PROTONS

被引：45

作者：

WYATT, RC ^{[1
]}

MCNULTY, PJ ^{[1
]}

TOUMBAS, P ^{[1
]}

ROTHWELL, PL ^{[1
]}

FILZ, RC ^{[1
]}

机构：

[1] USAF,GEOPHYS LAB,HANSCOM AFB,MA 01731

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1979年 / 26卷 / 06期

关键词：

D O I：

10.1109/TNS.1979.4330248

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

[No abstract available]

引用

页码：4905 / 4910

页数：6

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May Theresa, COMMUNICATION

[8] COSMIC-RAY INDUCED ERRORS IN MOS MEMORY CELLS [J].

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BLANDFORD, JT .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (06) :1166-1171

[9] ALPHA-PARTICLE TRACKS IN SILICON AND THEIR EFFECT ON DYNAMIC MOS RAM RELIABILITY [J].

YANEY, DS ;

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IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (01) :10-16

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