K-SHELL CROSS-SECTION FOR 80-KV ELECTRONS IN SINGLE-CRYSTAL GRAPHITE AND AIN

被引：10

作者：

ROSSOUW, CJ ^{[1
]}

WHELAN, MJ ^{[1
]}

机构：

[1] UNIV OXFORD, DEPT MET & MAT SCI, OXFORD OX1 3PH, ENGLAND

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1979年 / 12卷 / 05期

关键词：

D O I：

10.1088/0022-3727/12/5/021

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The K-shell cross-section sigma k( alpha ) for 80 kV electrons traversing thin single crystals of graphite and aluminium nitride is measured from electron energy-loss spectra generated within an energy-selecting electron microscope. These values, and the variation with collection semi-angle alpha , are compared with values derived from Bethe theory for an isolated atom.

引用

页码：797 / 807

页数：11

共 36 条

[1] MEAN FREE PATH OF RELATIVISTIC ELECTRONS FOR PLASMON EXCITATION [J].

ASHLEY, JC ;

RITCHIE, RH .

PHYSICA STATUS SOLIDI, 1970, 40 (02) :623-&

[2] On the stopping of fast particles and on the creation of positive electrons [J].

Bethe, H ;

Heitler, W .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1934, 146 (A856) :0083-0112

[3]

Bethe H, 1930, ANN PHYS-BERLIN, V5, P325

[4]

CHERNS D, 1973, Z NATURFORSCH A, VA 28, P565

[5] CONTRIBUTION OF ELECTRON-ENERGY LOSS SPECTROSCOPY TO DEVELOPMENT OF ANALYTICAL ELECTRON-MICROSCOPY [J].

COLLIEX, C ;

COSSLETT, VE ;

LEAPMAN, RD ;

TREBBIA, P .

ULTRAMICROSCOPY, 1976, 1 (04) :301-315

[6]

CRAVEN AJ, 1979, PHIL MAG A, V38, P519

[7] AXIAL IMPERFECTIONS IN FILAMENTARY CRYSTALS OF ALUMINUM NITRIDE .I [J].

DRUM, CM .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (3P1) :816-+

[8] ROLE OF AUGER EFFECT IN DISPLACEMENT OF ATOMS IN SOLIDS BY IONIZING RADIATION [J].

DURUP, J ;

PLATZMAN, RL .

DISCUSSIONS OF THE FARADAY SOCIETY, 1961, (31) :156-&

[9] MODIFICATION OF A TRANSMISSION ELECTRON-MICROSCOPE TO GIVE ENERGY-FILTERED IMAGES AND DIFFRACTION PATTERNS, AND ELECTRON-ENERGY LOSS SPECTRA [J].

EGERTON, RF ;

PHILIP, JG ;

TURNER, PS ;

WHELAN, MJ .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (12) :1033-1037

[10] DIRECT MEASUREMENT OF CONTAMINATION AND ETCHING RATES IN AN ELECTRON-BEAM [J].

EGERTON, RF ;

ROSSOUW, CJ .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (04) :659-663

← 1 2 3 4 →