CHARACTERIZATION OF CARBIDES BY SCANNING TUNNELING MICROSCOPY

被引：8

作者：

BONNELL, DA

机构：

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1988年 / 105卷

关键词：

D O I：

10.1016/0025-5416(88)90480-6

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：55 / 63

页数：9

共 13 条

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BONNELL, DA ;

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[7] SCANNING TUNNELING MICROSCOPY [J].

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[9] IMPORTANCE OF GEOMETRY, FIELD, AND TEMPERATURE IN TUNNELING AND RECTIFICATION BEHAVIOR OF POINT CONTACT JUNCTIONS OF IDENTICAL METALS [J].

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[10]

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