ELASTIC-PLASTIC FINITE-ELEMENT METHOD ANALYSIS AND APPLICATION OF THE ISLAND BLISTER TEST

被引：3

作者：

MARGARITIS, G ^{[1
]}

SIKORSKI, SA ^{[1
]}

MCGARRY, FJ ^{[1
]}

机构：

[1] MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139

来源：

JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY | 1994年 / 8卷 / 03期

关键词：

ADHESION; BLISTER TESTS; ELECTRONICS PACKAGING; PEEL TESTS; POLYMER THIN FILMS;

D O I：

10.1163/156856194X01112

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

Finite element method (FEM) modeling of the island blister test (IBT), which takes into account the possibility of plasticity in the film and can separate the normal and shear components of the specific fracture energy, is presented. IBT specimens of a polymer film (Ultradel 4212) on a chromium-coated silicon substrate were prepared and tested using modified procedures which am described. The analysis of the experimental results shows that crack propagation occurs when the mode I component of the specific fracture energy reaches a critical value.

引用

页码：273 / 287

页数：15

共 27 条

[1]

Allen M., 1986, THESIS MIT

[2] ANALYSIS OF CRITICAL DEBONDING PRESSURES OF STRESSED THIN-FILMS IN THE BLISTER TEST [J].