共 3 条
- [1] OBSERVATION OF DIFFUSION EFFECTS OCCURRING DURING THE ARTIFICIAL AGING OF DUAL LAYER BI-METAL FILMS PHYSICAL REVIEW, 1954, 93 (04): : 937 - 937
- [3] Effects of barrier height (φB) and the nature of bi-layer structure on the reliability of high-k dielectrics with dual metal gate (Ru & Ru-Ta alloy) technology 2004 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2004, : 138 - 139