INTERFEROMETRIC CHARACTERIZATION OF 160 FS FAR-INFRARED LIGHT-PULSES

被引:88
作者
GREENE, BI [1 ]
FEDERICI, JF [1 ]
DYKAAR, DR [1 ]
JONES, RR [1 ]
BUCKSBAUM, PH [1 ]
机构
[1] UNIV MICHIGAN,DEPT PHYS,ANN ARBOR,MI 48109
关键词
D O I
10.1063/1.105268
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the first interferometric characterization of freely propagating, subpicosecond, far-infrared (FIR) light pulses. FIR light was generated via short pulse photoexcitation of a semi-insulating InP wafer. The half width of the intensity interferogram was 230 fs. The FIR light contained frequency components from 3 to 150 cm-1.
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页码:893 / 895
页数:3
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