FIELD-EMISSION ELECTRON-MICROSCOPE

被引:0
作者
TONOMURA, A [1 ]
KOMODA, T [1 ]
机构
[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI 183,TOKYO,JAPAN
来源
JOURNAL OF ELECTRON MICROSCOPY | 1973年 / 22卷 / 02期
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中图分类号
TH742 [显微镜];
学科分类号
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页码:141 / 147
页数:7
相关论文
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