THE USE OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND IMAGE SIMULATION TO DETERMINE THE SHARPNESS OF INP/GAINAS INTERFACES IN MULTIPLE QUANTUM-WELL STRUCTURES

被引：8

作者：

PETFORDLONG, AK ^{[1
]}

BOOKER, GR ^{[1
]}

HOCKLY, M ^{[1
]}

机构：

[1] BRITISH TELECOMMUN PLC,IPSWICH,ENGLAND

来源：

ULTRAMICROSCOPY | 1989年 / 31卷 / 04期

关键词：

D O I：

10.1016/0304-3991(89)90337-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：385 / 398

页数：14

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