DETERMINATION OF OXYGEN IN METALS AND SEMICONDUCTORS BY MEANS OF O-16(T,N)18 F REACTION

被引：35
作者：
VALLADON, M [1 ]
DEBRUN, JL [1 ]
机构：
[1] CNRS,CYCLOTRON SERV,APPLICAT REACT NUCL ANAL CHIM GRP,F-45045 ORLEANS,FRANCE
来源：
JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1977年 / 39卷 / 1-2期
关键词：
D O I：
10.1007/BF02517244
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：385 / 395
页数：11
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