CONTRAST AND RESOLUTION OF SCANNING-TRANSMISSION ELECTRON-MICROSCOPE IMAGING MODES

被引:10
作者
REICHELT, R
ENGEL, A
机构
[1] Univ of Basel, Basel, Switz, Univ of Basel, Basel, Switz
关键词
The authorsw ould like to acknowledgMe . Zoller; M . J~iggi and E. Amstutzfo r theiri ntensive help to prepareth ism anuscripatn dP rofessoMr . Beer for reviewingit . We are veryg ratefutlo W. Vilhgerw hop rovidedth eEpon sectionws ithgold particlesD; r. A. Gautier( Centred e Microscopic ElectroniqueU; n iversit6d e Lausannef)o r making availablet he HM20 embeddedu nstainedD i. noflagellate Prorocentrum micans E and M. Di~rrenbergwerh og aveu s thee mbeddeEd. coli B sampleT. he work was supportedb y Grant No. 3.251-0.82(A E) of the Swiss NationalS cience Foundation;
D O I
10.1016/0304-3991(86)90006-9
中图分类号
TH742 [显微镜];
学科分类号
摘要
23
引用
收藏
页码:43 / 56
页数:14
相关论文
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