FABRICATION AND X-RAY-DIFFRACTION STUDIES OF ER/C MULTILAYER FILMS

被引:1
作者
GU, E [1 ]
PLAYER, MA [1 ]
MARR, GV [1 ]
SAVALONI, H [1 ]
机构
[1] UNIV ABERDEEN,DEPT ENGN,ENGN PHYS GRP,ABERDEEN AB9 2UE,SCOTLAND
关键词
D O I
10.1016/0304-8853(93)90542-A
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A new rare earth metal multilayer film with a combination of erbium and carbon has been synthesized. The structural properties of such Er/C multilayer films were characterized by X-ray diffraction. The results indicate that compositional periodic structure can be established in Er/C multilayer films\and this periodic structure is relatively stable. These multilayer films show amorphous nature and their structural properties are determined to a great extent by design parameters.
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页码:48 / 51
页数:4
相关论文
共 10 条
[1]   CHARACTERIZATION OF EVAPORATED ERBIUM FILMS AT VARIOUS STAGES OF GROWTH [J].
GU, ED ;
SAVALONI, H ;
PLAYER, MA ;
MARR, GV .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1992, 53 (01) :127-136
[2]   TUNGSTEN-CARBON MULTILAYER COMPOSITION AND THE EFFECTS OF ANNEALING - A GLANCING ANGLE EXTENDED X-RAY ABSORPTION FINE-STRUCTURE STUDY [J].
LAMBLE, GM ;
HEALD, SM ;
SAYERS, DE ;
ZIEGLER, E ;
VICCARO, PJ .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (11) :4250-4255
[3]   MAGNETIC-PROPERTIES AND STRUCTURE OF DYNI/MO MULTILAYERS [J].
PERERA, P ;
OSHEA, MJ ;
FERT, A .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (08) :5292-5294
[4]   HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF X-RAY MULTILAYER STRUCTURES [J].
PETFORDLONG, AK ;
STEARNS, MB ;
CHANG, CH ;
NUTT, SR ;
STEARNS, DG ;
CEGLIO, NM ;
HAWRYLUK, AM .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (04) :1422-1428
[5]   EXTENDED X-RAY ABSORPTION FINE-STRUCTURE STUDIES OF STRUCTURE AND SHORT-RANGE ORDER IN C-ER BILAYER AND ER/C MULTILAYER FILMS [J].
PLAYER, MA ;
MARR, GV ;
GU, E ;
SAVALONI, H ;
MUNRO, IH .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :1474-1477
[6]   PREFERRED ORIENTATION IN ERBIUM THIN-FILMS OBSERVED USING SYNCHROTRON RADIATION [J].
PLAYER, MA ;
MARR, GV ;
GU, E ;
SAVALONI, H ;
ONCAN, N ;
MUNRO, IH .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 :770-777
[7]   BRAGG CONDITION IN ABSORBING X-RAY MULTILAYERS [J].
ROSENBLUTH, AE ;
LEE, P .
APPLIED PHYSICS LETTERS, 1982, 40 (06) :466-468
[8]   INFLUENCE OF SUBSTRATE-TEMPERATURE, DEPOSITION RATE, SURFACE TEXTURE AND MATERIAL ON THE STRUCTURE OF UHV DEPOSITED ERBIUM FILMS [J].
SAVALONI, H ;
PLAYER, MA ;
GU, E ;
MARR, GV .
VACUUM, 1992, 43 (10) :965-980
[9]   MAGNETISM AND ANISOTROPY OF TB/FE MULTILAYERS [J].
SHAN, ZS ;
SELLMYER, DJ .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (09) :5713-5715
[10]   STRUCTURE OF TI/SIO2 THIN MULTILAYERS SPUTTERED IN ARGON-HYDROGEN MIXTURES [J].
YACHI, T .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1985, 3 (05) :1955-1958