ROLE PLAYED BY N AND N-N IMPURITIES IN TYPE-IV SEMICONDUCTORS

被引:25
作者
CUNHA, C [1 ]
CANUTO, S [1 ]
FAZZIO, A [1 ]
机构
[1] UFPE,DEPT FIS,BR-50732910 RECIFE,PE,BRAZIL
来源
PHYSICAL REVIEW B | 1993年 / 48卷 / 24期
关键词
D O I
10.1103/PhysRevB.48.17806
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ab initio all-electron Hartree-Fock calculations within the molecular-cluster model are performed to analyze the role of N impurities, both isolated and complex, in type-IV semiconductors. The results are used to investigate the structural and electronic properties. For isolated impurities the N atom distorts in the (111) direction towards a vacancy leading to a final local C-3 upsilon symmetry. The N atom forms sp(2) bonds with the host atoms and leaves an unoccupied N lone pair. For Nz both N atoms tend to form similar sp(2) bonds and move away from each other in the (111) direction without N-N bond formation. For the case of N-2(+), localized N-N hole states are obtained. A detailed picture at the orbital level is given. These achievements should also be important for amorphous hydrogenated semiconductors.
引用
收藏
页码:17806 / 17810
页数:5
相关论文
共 33 条
[1]   DEEP-LEVEL NITROGEN CENTERS IN LASER-ANNEALED ION-IMPLANTED SILICON [J].
BROWER, KL .
PHYSICAL REVIEW B, 1982, 26 (11) :6040-6052
[2]   MULTIPLE-SCATTERING X-ALPHA MOLECULAR-CLUSTER MODEL OF COMPLEX DEFECTS IN SEMICONDUCTORS - APPLICATION TO SI-P2 AND SI-P2+ SYSTEMS [J].
CALDAS, MJ ;
LEITE, JR ;
FAZZIO, A .
PHYSICAL REVIEW B, 1982, 25 (04) :2603-2610
[3]   BROKEN ORBITAL SYMMETRY STUDY OF LOW-LYING EXCITED AND N1S IONIZED STATES OF PYRAZINE [J].
CANUTO, S ;
GOSCINSKI, O ;
ZERNER, M .
CHEMICAL PHYSICS LETTERS, 1979, 68 (01) :232-236
[4]   MANY-ELECTRON TREATMENT OF THE OFF-CENTER SUBSTITUTIONAL O IN SI [J].
CANUTO, S ;
FAZZIO, A .
PHYSICAL REVIEW B, 1986, 33 (06) :4432-4435
[5]  
CHAMBOULEYRON I, 1993, APPL PHYS LETT, V62, P1
[6]  
DUPUIS M, 1980, COMPUTER CODE GAMESS
[7]   1ST-PRINCIPLES SUPERCELL STUDIES OF THE NITROGEN IMPURITY IN DIAMOND [J].
ERWIN, SC ;
PICKETT, WE .
PHYSICAL REVIEW B, 1990, 42 (17) :11056-11062
[8]  
FAZZIO A, 1992, MATER SCI FORUM, V83, P463, DOI 10.4028/www.scientific.net/MSF.83-87.463
[9]  
Hay P.J., 1977, METHODS ELECT STRUCT, P1
[10]   HIGH-QUALITY SILICON ON INSULATOR STRUCTURES FORMED BY THE THERMAL REDISTRIBUTION OF IMPLANTED NITROGEN [J].
HEMMENT, PLF ;
PEART, RF ;
YAO, MF ;
STEPHENS, KG ;
CHATER, RJ ;
KILNER, JA ;
MEEKISON, D ;
BOOKER, GR ;
ARROWSMITH, RP .
APPLIED PHYSICS LETTERS, 1985, 46 (10) :952-954