INTERNATIONAL MEETING ON ACCURATE DETERMINATION OF X-RAY INTENSITIES AND STRUCTURE FACTORS - FOREWORD

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作者：
MATHIESO.AM
机构：
来源：
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY | 1969年 / A 25卷
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中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
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页码：U001 / +
页数：1
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