METAL SI BONDING IN CU/SI(111) 5X5 USING ANGLE-RESOLVED ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY AND BAND-STRUCTURE CALCULATIONS

被引：11

作者：

CHAMBLISS, DD

RHODIN, TN

KASOWSKI, RV

机构：

[1] CORNELL UNIV,CORNELL MAT SCI CTR,ITHACA,NY 14853

[2] DUPONT CO,EXPTL STN,WILMINGTON,DE 19898

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 03期

关键词：

D O I：

10.1116/1.575348

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1499 / 1502

页数：4

共 9 条

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[9] BULK AND SURFACE ELECTRONIC-STRUCTURES OF SI(111)2X1 AND SI(111)7X7 STUDIED BY ANGLE-RESOLVED PHOTOELECTRON-SPECTROSCOPY [J].

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