SHIELDING OF IMPURITIES AS MEASURED BY EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE

被引：16
|
作者：
STERN, EA
SAYERS, DE
机构：
[1] UNIV WASHINGTON,PHYS DEPT,SEATTLE,WA 98195
[2] BOEING CO,SEATTLE,WA 98124
来源：
PHYSICAL REVIEW LETTERS | 1973年 / 30卷 / 05期
关键词：
D O I：
10.1103/PhysRevLett.30.174
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：174 / 177
页数：4
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