APPLICATION OF SR-XFA FOR IDENTIFICATION OF THE BASIC COMPOSITION OF HIGH-TEMPERATURE SUPERCONDUCTORS

被引：8

作者：

TRUNOVA, VA ^{[1
]}

DANILOVICH, VS ^{[1
]}

BARYSHEV, VB ^{[1
]}

ZOLOTAREV, KV ^{[1
]}

机构：

[1] NOVOSIBIRSK NUCL PHYS INST,NOVOSIBIRSK 630090,RUSSIA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1991年 / 308卷 / 1-2期

关键词：

D O I：

10.1016/0168-9002(91)90659-E

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The technique of simultaneous identification of the basic components (except for oxygen) in high-temperature superconductor (HTSC) films is described. X-ray fluorescence analysis of the films was performed using a monochromatized SR beam from the VEPP-3 storage ring. To reduce the substrate background we used the method of complete reflection of exciting radiation from the surface of a sample. The layout of the device is depicted, and first results are reported. The technique can be applied to the identification of the contents of microimpurities in films and large HTSC samples.

引用

页码：321 / 324

页数：4

共 8 条

[1] REVIEW OF X-RAY FLUORESCENT ANALYSIS USING SYNCHROTRON RADIATION [J].