共 50 条
- [1] APPLICATION OF HILLOCK ETCHING OF MICRODEFECTS TO INVESTIGATION OF CZOCHRALSKI SILICON BY TRANSMISSION ELECTRON-MICROSCOPY PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1978, 48 (02): : K105 - &
- [4] STUDY OF PRECIPITATE FORMATION IN ALUMINUM-COPPER ALLOYS BY POSITRON-ANNIHILATION AND TRANSMISSION ELECTRON-MICROSCOPY PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1980, 41 (02): : 145 - 156
- [6] CHARACTERIZATION OF SEMICONDUCTOR SILICON BY TRANSMISSION ELECTRON-MICROSCOPY PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 452 : 170 - 176
- [7] EBIC SCANNING ELECTRON-MICROSCOPY AND TRANSMISSION ELECTRON-MICROSCOPY OF SILICON GRAIN-BOUNDARIES JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1988, 13 (03): : A31 - A31
- [10] TRANSMISSION ELECTRON-MICROSCOPY OF THE FORMATION OF NICKEL SILICIDES PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 45 (01): : 31 - 47