TEST STRUCTURE FOR CARACTERIZATION AND CONTROL OF A MOS LARGE-SCALE INTEGRATED TECHNOLOGY

被引：0
|
作者：
LAGORSSE, JM
LEFEBVRE, F
机构：
来源：
ONDE ELECTRIQUE | 1978年 / 58卷 / 12期
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：823 / 829
页数：7
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