Spectrometric Characteristics of Various Detectors for X-Ray Determination of Iodine from K-Series Line Emission using Am-241 as the Source

Results of the studies of spectrometric characteristics of scintillation and semiconductor detectors with crystals from Nal(Tl), CdTe, CdZnTe, Si(PIN), Si(Li), Ge(HP) for registration of X-rays in the energy range from 20 keV to 60 keV are present. The energy resolution, the presence of escaping peaks, peaks from the radiation of structural and technological elements was determined and a comparison of the effectiveness of the registration was done on the base of the investigating of the response functions (spectra). Performance capabilities and limitations of the detection units are shown for the X-ray radiometry determination of iodine content in carbon, using the K-series of characteristic X-ray radiation. Consideration is given to the methods of eliminating the interference between the analytical K-series line of iodine and the escape peaks. It has been established that for the development of measuring techniques to determine the iodine mass fraction in carbon with the use of the installation operating at stationary conditions and having high analytical characteristics, it is preferable to use the detection unit with the Ge(HP) crystal. If however, small size and portability of the device are among the priority claims, then it is advantageous to use the detection unit with the thermoelectrically cooled CdTe crystal, and also, the secondary radiator.