PROBE LAYER MEASUREMENTS OF ELECTRO-LUMINESCENCE EXCITATION IN AC THIN-FILM DEVICES

被引：35

作者：

MARRELLO, V ^{[1
]}

SAMUELSON, L ^{[1
]}

ONTON, A ^{[1
]}

REUTER, W ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

JOURNAL OF APPLIED PHYSICS | 1981年 / 52卷 / 05期

关键词：

D O I：

10.1063/1.329091

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3590 / 3599

页数：10

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