PROBE LAYER MEASUREMENTS OF ELECTRO-LUMINESCENCE EXCITATION IN AC THIN-FILM DEVICES

被引：35
|
作者：
MARRELLO, V [1 ]
SAMUELSON, L [1 ]
ONTON, A [1 ]
REUTER, W [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
JOURNAL OF APPLIED PHYSICS | 1981年 / 52卷 / 05期
关键词：
D O I：
10.1063/1.329091
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：3590 / 3599
页数：10
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