A QUASI-BAYES ESTIMATE OF THE FAILURE INTENSITY OF A RELIABILITY-GROWTH MODEL

被引：23
|
作者：
HIGGINS, JJ [1 ]
TSOKOS, CP [1 ]
机构：
[1] UNIV S FLORIDA,DEPT MATH,TAMPA,FL 33620
来源：
IEEE TRANSACTIONS ON RELIABILITY | 1981年 / 30卷 / 05期
关键词：
D O I：
10.1109/TR.1981.5221176
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：471 / 475
页数：5
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