ASPECTS OF DARK-FIELD ELECTRON-MICROSCOPY

被引：1
|
作者：
PERRIER, F [1 ]
机构：
[1] CNRS,LAB OPTIQUE ELECTR,BP 4007,31055 TOULOUSE,FRANCE
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1973年 / 98卷 / AUG期
关键词：
D O I：
10.1111/j.1365-2818.1973.tb03839.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：352 / 358
页数：7
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