ASPECTS OF DARK-FIELD ELECTRON-MICROSCOPY

被引：1

|

作者：

PERRIER, F ^{[1
]}

机构：

[1] CNRS,LAB OPTIQUE ELECTR,BP 4007,31055 TOULOUSE,FRANCE

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1973年 / 98卷 / AUG期

关键词：

D O I：

10.1111/j.1365-2818.1973.tb03839.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：352 / 358

页数：7

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