INFLUENCE OF SUBSTRATE CURRENT ON HOLD-TIME CHARACTERISTICS OF DYNAMIC MOS ICS

被引：8
作者：
KUDOH, O
TSURUMI, M
YAMANAKA, H
WADA, T
机构：
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1978年 / 13卷 / 02期
关键词：
D O I：
10.1109/JSSC.1978.1051025
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：235 / 239
页数：5
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