BALLISTIC ELECTRON-TRANSPORT IN THIN SILICON DIOXIDE FILMS

被引:83
作者
FISCHETTI, MV
DIMARIA, DJ
DORI, L
BATEY, J
TIERNEY, E
STASIAK, J
机构
关键词
D O I
10.1103/PhysRevB.35.4404
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:4404 / 4415
页数:12
相关论文
共 46 条
[1]   SCATTERING BY IONIZATION AND PHONON EMISSION IN SEMICONDUCTORS [J].
ALIG, RC ;
BLOOM, S ;
STRUCK, CW .
PHYSICAL REVIEW B, 1980, 22 (12) :5565-5582
[2]   ELECTRONIC-PROPERTIES OF TWO-DIMENSIONAL SYSTEMS [J].
ANDO, T ;
FOWLER, AB ;
STERN, F .
REVIEWS OF MODERN PHYSICS, 1982, 54 (02) :437-672
[3]   EFFECT OF POST-OXIDATION ANNEAL ON ULTRATHIN SIO2 GATE OXIDES [J].
ARIENZO, M ;
DORI, L ;
SZABO, TN .
APPLIED PHYSICS LETTERS, 1986, 49 (16) :1040-1042
[4]   DEFORMATION POTENTIALS AND MOBILITIES IN NON-POLAR CRYSTALS [J].
BARDEEN, J ;
SHOCKLEY, W .
PHYSICAL REVIEW, 1950, 80 (01) :72-80
[5]   LOW-TEMPERATURE DEPOSITION OF HIGH-QUALITY SILICON DIOXIDE BY PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITION [J].
BATEY, J ;
TIERNEY, E .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (09) :3136-3145
[6]  
BATEY J, IN PRESS IEEE ELECTR
[7]   DIRECT MEASUREMENT OF THE ENERGY-DISTRIBUTION OF HOT-ELECTRONS IN SILICON DIOXIDE [J].
BRORSON, SD ;
DIMARIA, DJ ;
FISCHETTI, MV ;
PESAVENTO, FL ;
SOLOMON, PM ;
DONG, DW .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (03) :1302-1313
[8]   THE EFFECT OF COLLISIONAL BROADENING ON MONTE-CARLO SIMULATIONS OF HIGH-FIELD TRANSPORT IN SEMICONDUCTOR-DEVICES [J].
CAPASSO, F ;
PEARSALL, TP ;
THORNBER, KK .
ELECTRON DEVICE LETTERS, 1981, 2 (11) :295-297
[9]   MONTE-CARLO SIMULATION OF IMPACT IONIZATION IN GAAS INCLUDING QUANTUM EFFECTS [J].
CHANG, YC ;
TING, DZY ;
TANG, JY ;
HESS, K .
APPLIED PHYSICS LETTERS, 1983, 42 (01) :76-78
[10]   ELECTRON-STATES IN ALPHA-QUARTZ - SELF-CONSISTENT PSEUDOPOTENTIAL CALCULATION [J].
CHELIKOWSKY, JR ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1977, 15 (08) :4020-4029