GAAS PN JUNCTION STUDIED BY SCANNING TUNNELING POTENTIOMETRY

被引:37
作者
MURALT, P [1 ]
机构
[1] IBM CORP,RES LAB ZURICH,CH-8803 RUSCHLIKON,SWITZERLAND
关键词
D O I
10.1063/1.97348
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:1441 / 1443
页数:3
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共 13 条
[1]   TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180
[2]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[3]   TUNNELING SPECTROSCOPY IN GAAS [J].
CONLEY, JW ;
MAHAN, GD .
PHYSICAL REVIEW, 1967, 161 (03) :681-+
[4]   SURFACE-MORPHOLOGY OF GAAS(110) BY SCANNING TUNNELING MICROSCOPY [J].
FEENSTRA, RM ;
FEIN, AP .
PHYSICAL REVIEW B, 1985, 32 (02) :1394-1396
[5]   MONO-ATOMIC TIPS FOR SCANNING TUNNELING MICROSCOPY [J].
FINK, HW .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) :460-465
[6]   VOLTAGE DROP IN THE EXPERIMENTS OF SCANNING TUNNELING MICROSCOPY FOR SI [J].
FLORES, F ;
GARCIA, N .
PHYSICAL REVIEW B, 1984, 30 (04) :2289-2291
[7]   SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE [J].
GERBER, C ;
BINNIG, G ;
FUCHS, H ;
MARTI, O ;
ROHRER, H .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) :221-224
[8]   ELECTRONIC SURFACE PROPERTIES OF 3-5 SEMICONDUCTORS - EXCITONIC EFFECTS, BAND-BENDING EFFECTS, AND INTERACTIONS WITH AU AND O ADSORBATE LAYERS [J].
GUDAT, W ;
EASTMAN, DE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04) :831-837
[9]   ELECTRONIC SURFACE PROPERTIES OF UHV-CLEAVED 3-5 COMPOUNDS [J].
HUIJSER, A ;
VANLAAR, J ;
VANROOY, TL .
SURFACE SCIENCE, 1977, 62 (02) :472-486
[10]  
MUELLER EW, 1974, PROGR SURFACE SCI, V4