Anomalous luminescence efficiency enhancement of short-term aged GaN-based blue light-emitting diodes

被引:10
作者
Cao Kewei [1 ]
Fu Binglei [2 ]
Liu Zhe [2 ]
Zhao Lixia [2 ]
Li Jinmin [2 ]
Wang Junxi [2 ]
机构
[1] Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
[2] Chinese Acad Sci, Res & Dev Ctr Semicond Lighting, Beijing 100083, Peoples R China
关键词
light emitting diodes; aging; rate-equation model; defect reduction;
D O I
10.1088/1674-4926/37/1/014008
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The origin of anomalous luminescence efficiency enhancement of short-term aged GaN-based blue light-emitting diodes was studied. We found that the intensity of the electroluminescence and photoluminescence spectra were both increased in the very beginning period of aging. With the help of a rate-equation model, we concluded that this kind of luminescence efficiency enhancement is a joint effect of the defect reduction in active layers and the changes out of active layers, for example the Mg acceptor annealing.
引用
收藏
页数:4
相关论文
共 13 条
[1]   P-TYPE CONDUCTION IN MG-DOPED GAN TREATED WITH LOW-ENERGY ELECTRON-BEAM IRRADIATION (LEEBI) [J].
AMANO, H ;
KITO, M ;
HIRAMATSU, K ;
AKASAKI, I .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (12) :L2112-L2114
[2]   Single-quantum well InGaN green light emitting diode degradation under high electrical stress [J].
Barton, DL ;
Osinski, M ;
Perlin, P ;
Eliseev, PG ;
Lee, J .
MICROELECTRONICS RELIABILITY, 1999, 39 (08) :1219-1227
[3]  
Byun D, 2001, PHYS STATUS SOLIDI B, V228, P315, DOI 10.1002/1521-3951(200111)228:1<315::AID-PSSB315>3.0.CO
[4]  
2-Z
[5]   Interdiffusion of In and Ga in InGaN/GaN multiple quantum wells [J].
Chuo, CC ;
Lee, CM ;
Chyi, JI .
APPLIED PHYSICS LETTERS, 2001, 78 (03) :314-316
[6]   Efficiency degradation behaviors of current/thermal co-stressed GaN-based blue light emitting diodes with vertical-structure [J].
Liu, Lilin ;
Ling, Minjie ;
Yang, Jianfu ;
Xiong, Wang ;
Jia, Weiqing ;
Wang, Gang .
JOURNAL OF APPLIED PHYSICS, 2012, 111 (09)
[7]   The activation of Mg in GaN by annealing with minority-carrier injection [J].
Miyachi, M ;
Tanaka, T ;
Kimura, Y ;
Ota, H .
APPLIED PHYSICS LETTERS, 1998, 72 (09) :1101-1103
[8]   Optical evidence of an electrothermal degradation of InGaN-based light-emitting diodes during electrical stress [J].
Pavesi, M ;
Manfredi, M ;
Salviati, G ;
Armani, N ;
Rossi, F ;
Meneghesso, G ;
Levada, S ;
Zanoni, E ;
Du, S ;
Eliashevich, I .
APPLIED PHYSICS LETTERS, 2004, 84 (17) :3403-3405
[9]   Identification of aging mechanisms in the optical and electrical characteristics of light-emitting diodes [J].
Pursiainen, O ;
Linder, N ;
Jaeger, A ;
Oberschmid, R ;
Streubel, K .
APPLIED PHYSICS LETTERS, 2001, 79 (18) :2895-2897
[10]   Influence of short-term low current dc aging on the electrical and optical properties of InGaN blue light-emitting diodes [J].
Rossi, F ;
Pavesi, M ;
Meneghini, M ;
Salviati, G ;
Manfredi, M ;
Meneghesso, G ;
Castaldini, A ;
Cavallini, A ;
Rigutti, L ;
Strass, U ;
Zehnder, U ;
Zanoni, E .
JOURNAL OF APPLIED PHYSICS, 2006, 99 (05)