LATTICE INTERACTION NOISE OF HOT CARRIERS IN SINGLE INJECTION SOLID-STATE DIODES

被引：28

作者：

GISOLF, A ^{[1
]}

ZIJLSTRA, RJ ^{[1
]}

机构：

[1] FYS LAB RIJKS UNIV,UTRECHT,NETHERLANDS

来源：

SOLID-STATE ELECTRONICS | 1973年 / 16卷 / 05期

关键词：

D O I：

10.1016/0038-1101(73)90156-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：571 / 580

页数：10

共 18 条

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[2] HOT ELECTRON EFFECTS IN SINGLE-INJECTION SILICON SCL DIODES [J].

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VANDERZI.A .

SOLID-STATE ELECTRONICS, 1971, 14 (04) :265-&

[3]

CONWELL EM, 1967, SOLID ST PHYSICS S9

[4]

DRUYVESTEYN MG, 1930, PHYSICA, V10, P61

[5]

ERLBACH F, 1962, PHYS REV LETT, V8, P280

[6]

Lampert M.A., 1970, CURRENT INJECTION SO

[7] SPACE-CHARGE-LIMITED CURRENT TRANSIENT INCLUDING DIFFUSION [J].

LAMPERT, MA ;

SCHILLING, RB .

PHYSICAL REVIEW LETTERS, 1967, 18 (13) :493-+

[8] NOISE OF HOT HOLES IN SPACE-CHARGE-LIMITED GERMANIUM DIODES [J].

NICOLET, MA ;

BILGER, HR ;

SHUMKA, A .

SOLID-STATE ELECTRONICS, 1971, 14 (08) :667-&

[9]

Price P. J., 1965, FLUCTUATION PHENOMEN

[10] HOT ELECTRONS IN GERMANIUM AND OHMS LAW [J].

SHOCKLEY, W .

BELL SYSTEM TECHNICAL JOURNAL, 1951, 30 (04) :990-1034

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