THE MEASUREMENT OF THE X-RAY-SCATTERING FACTORS OF SILICON FROM THE FINE-STRUCTURE OF LAUE-CASE ROCKING CURVES

被引：22
作者：
BONSE, U
TEWORTE, R
机构：
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1980年 / 13卷 / OCT期
关键词：
D O I：
10.1107/S0021889880012460
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：410 / 416
页数：7
相关论文
共 24 条
[1]   ELECTRON-DISTRIBUTION IN SILICON .2. THEORETICAL INTERPRETATION [J].
ALDRED, PJE ;
HART, M .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1973, 332 (1589) :239-254
[2]   ELECTRON-DISTRIBUTION IN SILICON .1. EXPERIMENT [J].
ALDRED, PJE ;
HART, M .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1973, 332 (1589) :223-+
[3]   X-RAY WAVELENGTHS [J].
BEARDEN, JA .
REVIEWS OF MODERN PHYSICS, 1967, 39 (01) :78-&
[4]  
BECKER P, 1974, COMMUNICATION
[5]   OSCILLATORY STRUCTURE OF LAUE CASE ROCKING CURVES [J].
BONSE, U ;
GRAEFF, W ;
TEWORTE, R ;
RAUCH, H .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 43 (02) :487-492
[6]  
BONSE U, UNPUBLISHED
[7]   AB INITIO COMPUTATIONS IN ATOMS AND MOLECULES [J].
CLEMENTI, E .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1965, 9 (01) :2-&
[8]   COVALENT BOND IN DIAMOND [J].
DAWSON, B .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1454) :264-&
[9]   A GENERAL STRUCTURE FACTOR FORMALISM FOR INTERPRETING ACCURATE X-RAY AND NEUTRON DIFFRACTION DATA [J].
DAWSON, B .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1454) :255-&
[10]   AVOGADRO CONSTANT - CORRECTIONS TO AN EARLIER REPORT [J].
DESLATTES, RD ;
HENINS, A ;
SCHOONOVER, RM ;
CARROLL, CL ;
BOWMAN, HA .
PHYSICAL REVIEW LETTERS, 1976, 36 (15) :898-900
123