ALPHA-PARTICLE SPECTROMETRY WITH SEMICONDUCTOR DETECTORS

被引：0
作者：
HOFKER, WK
NIENHUIS, K
POST, JC
机构：
来源：
PHILIPS TECHNICAL REVIEW | 1969年 / 30卷 / 01期
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D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
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页码：13 / +
页数：1
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